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High performance and transparent multilayer MoS2 transistors: Tuning Schottky barrier characteristics

Authors
Hong, Young KiYoo, GeonwookKwon, JunyeonHong, SeonginSong, Won GeunLiu, NaOmkaram, InturuYoo, ByungwookJu, SanghyunKim, SunkookOh, Min Suk
Issue Date
May-2016
Publisher
AMER INST PHYSICS
Citation
AIP ADVANCES, v.6, no.5
Journal Title
AIP ADVANCES
Volume
6
Number
5
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/83685
DOI
10.1063/1.4953062
ISSN
2158-3226
Abstract
Various strategies and mechanisms have been suggested for investigating a Schottky contact behavior in molybdenum disulfide (MoS2) thin-film transistor (TFT), which are still in much debate and controversy. As one of promising breakthrough for transparent electronics with a high device performance, we have realized MoS2 TFTs with source/drain electrodes consisting of transparent bi-layers of a conducting oxide over a thin film of low work function metal. Intercalation of a low work function metal layer, such as aluminum, between MoS2 and transparent source/drain electrodes makes it possible to optimize the Schottky contact characteristics, resulting in about 24-fold and 3 orders of magnitude enhancement of the field-effect mobility and on-off current ratio, respectively, as well as transmittance of 87.4 % in the visible wavelength range. (C) 2016 Author(s).
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BioNano Technology (Department of Physics)
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