Song, Eunji; Yang, Jeonghyu; Oh, Youngmin; Hong, Seungwook; Lee, Dongjun; Lee, Sangwan; Im, Hyunwoo; Shin, Taeho; Han, Jaeduk
ArticleIssue Date2025CitationIEEE Journal of Solid-State Circuits, v.60, no.2, pp 543 - 554PublisherInstitute of Electrical and Electronics Engineers