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Designing Robust Interfaces of HZO Module (>1012 at 85 °c) with High Sensing Margin (>300 mV) for ≤1.1 V 1T-1F with Common Plate Line and 1T-nF FeRAM Go to Link

Jeon, Intak; Lim, Hanjin; Kim, Seon-yong; Kim, Jin-soak; Ahn, Sehyoung; Jung, Changhwa; Kwon, Daewoong; Kwon, Hyucknam; Park, Sung-Wook

ArticleIssue Date2025CitationDigest of Technical Papers - Symposium on VLSI Technology, pp 1 - 3

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Structure-modulated phase stability and defect engineering in ferroelectric HfxZr1-xO2 heterostructures Go to Link

Han, Changhyeon; Kwak, Been; Choi, Joonhyeok; Kwon, Hyucknam; Kwon, Ki-Ryun; Choi, Rino; Kwon, Daewoong

ArticleIssue Date2025CitationMaterials Science in Semiconductor Processing, v.200, pp 1 - 7PublisherPergamon Press

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Structure-modulated phase stability and defect engineering in ferroelectric HfxZr1-xO2 heterostructures(vol 200 ,109995 , 2025)Go to Link

Han, Changhyeon; Kwak, Been; Choi, Joonhyeok; Kwon, Hyucknam; Kwon, Ki-Ryun; Choi, Rino; Kwon, Daewoong

ArticleIssue Date2026CitationMaterials Science in Semiconductor Processing, v.201, pp 1 - 1PublisherELSEVIER SCI LTD

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Browsing by Kwon, HyucknamAuthor

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