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Browsing by Lee, Won-BumAuthor

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SCIESCOPUS
Controlled 2D growth approach via atomic layer deposition for improved stability and performance in flexible SnO thin-film transistorsGo to Link

Kim, Hye-Mi; Lee, Won-Bum; Koo, Haklim; Kim, Seo-Yeong; Park, Jin-Seong

ArticleIssue Date2024CitationJournal of Materials Chemistry C, v.12, no.23, pp 8390 - 8397PublisherRoyal Society of Chemistry
SCIESCOPUS
Effects of Tensile Strain on Dynamic and Static Inverters Using Amorphous Indium-Gallium-Zinc-Oxide TFTsGo to Link

Kim, Yong-Duck; Han, Ki-Lim; Kim, Jun-Hyeok; Lee, Jong-Il; Lee, Won-Bum; Park, Jinseong; Choi, Byong-Deok

ArticleIssue Date2021CitationIEEE Electron Device Letters, v.42, no.3, pp.359 - 362PublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUS
Mechanical Durability of Flexible/Stretchable a-IGZO TFTs on PI Island for Wearable Electronic ApplicationGo to Link

Han, Ki-Lim; Lee, Won-Bum; Kim, Yong-Duck; Kim, Jun-Hyeok; Choi, Byong-Deok; Park, Jin-Seong

ArticleIssue Date2021CitationACS APPLIED ELECTRONIC MATERIALS, v.3, no.11, pp.5037 - 5047PublisherAMER CHEMICAL SOC
SCISCIESCOPUS
Recent review on improving mechanical durability for flexible oxide thin film transistorsGo to Link

Han, Ki-Lim; Jeong, Hyun-Jun; Kim, Beom-Su; Lee, Won-Bum; Park, Jin-Seong

ArticleIssue Date2019CitationJournal of Physics D: Applied Physics, v.52, no.48, pp 1 - 19PublisherIOP Publishing Ltd.
SCIESCOPUS
Soft Recovery Process of Mechanically Degraded Flexible a-IGZO TFTs With Various Rolling Stresses and Defect Simulation Using TCAD SimulationGo to Link

Kim, Beom-Su; Jeong, Hyun-Jun; Han, Ki-Lim; Lee, Won-Bum; Kim, Yoon-Seo; Park, Jin-Seong

ArticleIssue Date2020CitationIEEE Transactions on Electron Devices, v.67, no.2, pp 535 - 541PublisherInstitute of Electrical and Electronics Engineers
SCIESCOPUS
Stress-Relief Island Design of Island-Bridge Structured InZnO TFT for Form-Free Display Applications Using Spatial ALDGo to Link

Lee, Won-Bum; Kim, Min-Seo; Lee, Chi-Hoon; Lim, Jun Hyung; Park, Jin-Seong

ArticleIssue Date2025CitationACS APPLIED ELECTRONIC MATERIALS, v.7, no.14, pp 6680 - 6688PublisherAMER CHEMICAL SOC
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