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Grad-CAM(Gradient-Class Activation Map)을 이용한 웨이퍼 빈 맵 복합 불량 패턴 분해
- Authors
- 배석주
- Issue Date
- 21-May-2021
- Place
- 온라인
- Conference Name
- 2021년 한국품질경영학회 춘계학술대회
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Collections - 서울 공과대학 > 서울 산업공학과 > 2. Conference Papers
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Related Researcher
- Bae, Suk Joo
- COLLEGE OF ENGINEERING (DEPARTMENT OF INDUSTRIAL ENGINEERING)