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Enhanced mobility of Li-doped ZnO thin film transistors fabricated by mist chemical vapor deposition

Authors
Jeon, Hye-jiLee, Seul-GiKim, H.Park, Jin-Seong
Issue Date
May-2014
Publisher
ELSEVIER
Keywords
Chemical vapor deposition; Oxide semiconductor; Thin film transistor
Citation
APPLIED SURFACE SCIENCE, v.301, pp.358 - 362
Indexed
SCIE
SCOPUS
Journal Title
APPLIED SURFACE SCIENCE
Volume
301
Start Page
358
End Page
362
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/160059
DOI
10.1016/j.apsusc.2014.02.080
ISSN
0169-4332
Abstract
Mist chemical vapor deposition (mist-CVD)-processed, lithium (Li)-doped ZnO thin film transistors (TFTs) are investigated. Li doping significantly increases the field-effect mobility in TFTs up to similar to 100 times greater than that of undoped ZnO. The addition of Li into mist-CVD-grown ZnO semiconductors leads to improved film quality, which results from the enhanced crystallinity and reduced defect states, including oxygen vacancies. Our results suggest that Li doping of ZnO-based oxide semiconductors could serve as an effective strategy for high-performance, mist-CVD-processed oxide TFTs with low-cost and low-temperature fabrication.
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