The effect of Ta doping in polycrystalline TiOx and the associated thin film transistor properties
- Authors
- Ok, Kyung-Chul; Park, Yoseb; Chung, Kwun-Bum; Park, Jin-Seong
- Issue Date
- Nov-2013
- Publisher
- American Institute of Physics
- Citation
- Applied Physics Letters, v.103, no.21, pp 1 - 5
- Pages
- 5
- Indexed
- SCI
SCIE
SCOPUS
- Journal Title
- Applied Physics Letters
- Volume
- 103
- Number
- 21
- Start Page
- 1
- End Page
- 5
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/161599
- DOI
- 10.1063/1.4831783
- ISSN
- 0003-6951
1077-3118
- Abstract
- Tantalum (Ta) is suggested to act as an electron donor and crystal phase stabilizer in titanium oxide (TiOx). A transition occurs from an amorphous state to a crystalline phase at an annealing temperature above 300 degrees C in a vacuum ambient. As the annealing temperature increases from 300 degrees C to 450 degrees C, the mobility increases drastically from 0.07 cm(2)/Vs to 0.61 cm(2)/Vs. The remarkable enhancement of thin film transistor performance is suggested to be due to the splitting of Ti 3d band orbitals as well as the increase in Ta5+ ions that can act as electron donors.
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