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The effect of surface treatment of bottom contact organic thin film transistor

Authors
Park, Jin-SeongJeon, Woo SikPark, Jung SooKwon, Jang HyukSuh, Min Chul
Issue Date
Sep-2011
Publisher
ELSEVIER SCIENCE SA
Keywords
Organic thin film transistor (OTFT); PMMA; MNB; Contact resistance; Sequence of surface treatment; Wettability
Citation
SYNTHETIC METALS, v.161, no.17-18, pp.1953 - 1957
Indexed
SCIE
SCOPUS
Journal Title
SYNTHETIC METALS
Volume
161
Number
17-18
Start Page
1953
End Page
1957
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/167568
DOI
10.1016/j.synthmet.2011.07.001
ISSN
0379-6779
Abstract
A bottom contact organic thin film transistor (OTFT) is fabricated with an organic double-layered gate insulator (Cl) and pentacene. Poly(methyl methacrylate) (PMMA) and 2-mercapto 5-nitrobenzimidazole (MNB) layers are deposited on the gate insulator and source/drain gold (S/D. Au) electrode before depositing pentacene to investigate the device properties. The sequence of surface treatment significantly affects the device performance. The ultra-thin PMMA (less than 5 nm) was deposited on the organic gate insulator and S/D metal by the spin coating method, which caused no deterioration of the on-state current (I(on)), although a bottom contact structure was exploited. The lack of increase in the contact resistance (R(c)) may be due to the difference in wettability between PMMA/Au and PMMA/organic Cl. As a result, the devices treated with PMMA -˃ MNB showed much better I(on) behavior than those fabricated with MNB -˃ PMMA. We report on the difference in the physical and electrical performances associated with the surface treatment sequence.
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COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)
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