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High-Performance p-Channel Tellurium Thin-Film Transistor Applications Fabricated at a Low Temperature of 150 °C

Authors
Kim, TaikyuChoi, Cheol HeeJeong, Jae Kyeong
Issue Date
Jun-2022
Publisher
John Wiley and Sons Inc
Keywords
CMOS TFT; Inorganic p-type semiconductor; Tellurium; Thin-film transistor (TFT)
Citation
Digest of Technical Papers - SID International Symposium, v.53, no.1, pp.225 - 227
Indexed
SCOPUS
Journal Title
Digest of Technical Papers - SID International Symposium
Volume
53
Number
1
Start Page
225
End Page
227
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/171601
DOI
10.1002/sdtp.15459
ISSN
0097-966X
Abstract
Development of high-performance p-channel thin-film transistors (TFTs) can be an essential building block for next-generation display technologies which require a great power efficiency. While an n-channel In GaZnO TFT has been practically demonstrated, the counterparts are still challenging because of their ionic bonding nature. Here we report high-performance p-channel hexagonal tellurium (Te) TFT which exhibits outstanding device performances with a field-effect mobility of 21.2 cm2/Vs, a current modulation ratio of 2.3 × 10s, a subthreshold swing of 0.2 V/dec, and a threshold voltage of -0.3 V. This study shows a strong potential of p-channel Te TFT for next-generation display applications.
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