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Reproducible unipolar resistive switching behaviors in the metal-deficient CoOx thin film

Authors
Kwak, June SikDo, Young HoBae, Yoon CheolIm, HyunsikHong, Jin Pyo
Issue Date
Sep-2010
Publisher
ELSEVIER SCIENCE SA
Keywords
CoOx; Resistive switching; Nonvolatile memory; ReRAM
Citation
THIN SOLID FILMS, v.518, no.22, pp.6437 - 6440
Indexed
SCIE
SCOPUS
Journal Title
THIN SOLID FILMS
Volume
518
Number
22
Start Page
6437
End Page
6440
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/174146
DOI
10.1016/j.tsf.2010.03.050
ISSN
0040-6090
Abstract
Pt/CoOx/Pt tri-layers exhibited reproducible and stable unipolar switching under a dc sweeping voltage. In order to investigate the role of oxygen reduction in the metal-deficient CoOx layer, resistive switching of the post-annealed CoOx thin film was compared with those of the as-deposited CoO thin film. X-ray photoemission spectroscopy showed larger reproducible resistance switching and decreasing of current level in the post-annealed CoO thin film. This may be explained by a reduction in oxygen stoichiometry without phase transformation of the CoOx. In addition, stable switching in post-annealed CoOx layer is considered to originate from the decrease of the Co vacancies in local Co3O4 region partially distributed in the whole CoOx layer, not in the dominant CoO.
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