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Fabrication of microstructured silicon (mu s-Si) from a bulk Si wafer and its use in the printing of high-performance thin-film transistors on plastic substrates

Authors
Lee, Keon JaeAhn, HeejoonMotala, Michael J.Nuzzo, Ralph G.Menard, EtienneRogers, John A.
Issue Date
Jul-2010
Publisher
Institute of Physics Publishing
Citation
Journal of Micromechanics and Microengineering, v.20, no.7, pp 1 - 8
Pages
8
Indexed
SCI
SCIE
SCOPUS
Journal Title
Journal of Micromechanics and Microengineering
Volume
20
Number
7
Start Page
1
End Page
8
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/174485
DOI
10.1088/0960-1317/20/7/075018
ISSN
0960-1317
1361-6439
Abstract
In this paper, we report a new fabrication route to generate microstructured, single-crystalline silicon (mu s-Si) ribbons using (1 1 0) silicon. Two different methods were explored for producing these printable structures. This work also introduces a second-process innovation in the fabrication of microstructured semiconductor objects for printed large-area circuits, namely the direct integration of a high-quality, thermally grown silicon dioxide (SiO2) layer for use as a gate dielectric in top-gate metal-oxide-silicon field effect transistors. We also demonstrate and characterize a soft, conformable lamination process that considerably enhances the mechanical stability of devices printed on plastic, allowing bending radii as small as 0.8 cm. These structures enable a reduction of the bending strains localized at the device interface. These improvements were fully characterized by finite element simulations of the strain distribution present in a descriptive model of the multilayer laminated circuit.
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