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Thin transparent single-crystal silicon membranes made using a silicon-on-nitride wafer

Authors
Lee, Su HwanKim, Dal HoYang, Hee-DooKim, Sung-JunShin, Dong-WonWoo, Sung HaLee, Hun JooSeung, Hyun MinLee, Sarig-KeumLee, Gon-SubPark, Jea-Gun
Issue Date
Aug-2008
Publisher
KOREAN PHYSICAL SOC
Keywords
SOI; SON; etch-stop; silicon membrane; transparent single-crystal silicon
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.53, no.2, pp.579 - 583
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume
53
Number
2
Start Page
579
End Page
583
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/178081
DOI
10.3938/jkps.53.579
ISSN
0374-4884
Abstract
We have produced various transparent silicon membrane applications, such as solar cells, microstructures, sensors and displays by using silicon-on-nitride (SON) wafers. We first tried to make them by using silicon-on-insulator (SOI) wafers and a buried layer Of SiO2 as an etch-stop layer. However, during the wet-etching process, the buried SiO2 layer did not completely block the potassium hydroxide (KOH) etchant. The silicon membrane eventually formed micro-cracks and the membrane broke along the line of micro-cracks. Because the etching selectivity between Si and SiO2 is only 200 : 1 in 30 % KOH at 80 degrees C, the nanometer-order thickness Of SiO2 is insufficient for a suitable etch-stop layer. We have, therefore, developed a wafer that combines a dielectric etch-stop layer with a SOI wafer and that makes it possible to produce transparent silicon membranes of various thicknesses.
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