6H-SiC Solid State Detector Development for a Neutron Measurementopen access
- Authors
- Ha, Jang Ho; Kang, Sang Mook; Park, Se Hwan; Kim, Han Soo; Kim, Yong Kyun
- Issue Date
- Jun-2008
- Publisher
- TAYLOR & FRANCIS LTD
- Keywords
- solid state detector; semiconductor; silicon carbide; neutron measurement; surface barrier detector
- Citation
- JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, pp.352 - 355
- Indexed
- SCIE
SCOPUS
- Journal Title
- JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY
- Start Page
- 352
- End Page
- 355
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/178551
- DOI
- 10.1080/00223131.2008.10875861
- ISSN
- 0022-3131
- Abstract
- A new solid state detector based on 6H-SiC is one of the promising devices in the nuclear industry for high-level radiation applications in a harsh high-temperature environment. SiC is a semi-conductor with a 3.03-eV band gap energy, and known as a radiation-resistance material. SiC detectors were fabricated by using a 6H-SiC wafer. The properties of the 6H-SiC wafer were over a 106 ohm-cm resistivity, a 380 mu m thickness, and a (0001)-oriented type. The 6H-SiC detector was prepared by the processes of a dicing, etching, removal of an oxidation layer and a mounting on an alumina substrate. SiC detector was 10x10 mm(2) with a 19.6mm(2) active area. The circular metal contacts consisted of a Si-face/Ni/Au and a C-face/Ni/Au structure. Thin LiF and B film was coated onto the SiC detector surface for a neutron converter. The electrical current-voltage performances of the detectors were measured by using the Keithley 4200-SCS parameter analyzer with self voltage sources. Neutron responses were measured by using a Cf-252 source.
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