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Novel hybrid mask mold for combined nanoimprint and photolithography technique

Authors
Moon, KanghunChoi, BanglimPark, In-SungHong, SunghunYang, KihyunLee, HeonAhn, Jinho
Issue Date
Apr-2006
Publisher
ELSEVIER SCIENCE BV
Keywords
nanoimprint lithography; photolithography; hybrid mask mold; anti-sticking property
Citation
MICROELECTRONIC ENGINEERING, v.83, no.4-9, pp.889 - 892
Indexed
SCIE
SCOPUS
Journal Title
MICROELECTRONIC ENGINEERING
Volume
83
Number
4-9
Start Page
889
End Page
892
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/181580
DOI
10.1016/j.mee.2006.01.055
ISSN
0167-9317
Abstract
We present a combined nanoimprint and photolithography (CNP) process for nano-size patterning to greatly simplify conventional ultraviolet nanoimprint lithography. The mold is a key component for precise patterning with CNP, and a novel hybrid mask mold with SiO2 interlayer and hydrophobic agent treatment is suggested for easy detachment after imprinting. This allows a very simple process to get a complete pattern transfer without any defects.
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서울 공과대학 > 서울 신소재공학부 > 1. Journal Articles

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