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Photo-induced Current Transient Defect Analyses of oxide Semiconductor Materials by artificial interlligence 1D Convolutional neural networks
- Authors
- 홍진표
- Issue Date
- 23-Oct-2024
- Place
- 여수
- Conference Name
- 2024 KPS Fall meeting
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Hong, Jin Pyo
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)