Anisotropic temperature-dependent thermal conductivity by an Al₂O₃ interlayer in Al₂O₃/ZnO superiattice filmsAnisotropic temperature-dependent thermal conductivity by an Al2O3 interlayer in Al2O3/ZnO superiattice films
- Other Titles
- Anisotropic temperature-dependent thermal conductivity by an Al2O3 interlayer in Al2O3/ZnO superiattice films
- Authors
- Lee, Won-Yong; Lee, Jung-Hoon; Ahn, Jae-Young; Park, Tae-Hyun; Park, No-Won; Kim, Gil-Sung; Park, Jin-Seong; Lee, Sang-Kwon
- Issue Date
- Mar-2017
- Publisher
- IOP PUBLISHING LTD
- Keywords
- thermal conductivity; superlattice films; phonon scattering; 3-omega measurement
- Citation
- NANOTECHNOLOGY, v.28, no.10
- Indexed
- SCIE
SCOPUS
- Journal Title
- NANOTECHNOLOGY
- Volume
- 28
- Number
- 10
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/20527
- DOI
- 10.1088/1361-6528/aa5985
- ISSN
- 0957-4484
- Abstract
- The thermal conductivity of superlattice films is generally anisotropic and should be studied separately in the in-plane and cross-plane directions of the films. However, previous works have mostly focused on the cross-plane thermal conductivity because the electrons and phonons in the cross-plane direction of superlattice films may result in much stronger interface scattering than that in the in-plane direction. Nevertheless, it is highly desirable to perform systematic studies on the effect of interface formation in semiconducting superlattice films on both in-plane and cross-plane thermal conductivities. In this study, we determine both the in-plane and cross-plane thermal conductivities of Al₂O₃ (AO)/ZnO superlattice films grown by atomic layer deposition (ALD) on SiO₂/Si substrates in the temperature range of 50-300 K by the four-point-probe 3-ω method. Our experimental results indicate that the formation of an atomic AO layer (0.82 nm) significantly contributes to the decrease of the cross-plane thermal conductivity of the AO/ZnO superlattice films compared with that of AO/ZnO thin films. The cross-plane thermal conductivity (0.26-0.63 W m⁻¹ K⁻¹ of the AO/ZnO superlattice films (with an AO layer of ∼0.82 nm thickness) is approximately ∼150%-370% less than the in-plane thermal conductivity (0.96⁻¹.19 W m⁻¹ K⁻¹) of the corresponding film, implying significant anisotropy. This indicates that the suppression of the cross-plane thermal conductivity is mainly attributed to the superlattice, rather than the nanograin columnar structure in the films. In addition, we theoretically analyzed strong anisotropic behavior of the in-plane and cross-plane thermal conductivities of the AO/ZnO superlattice films in terms of temperature dependence.
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