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Process-Portable Layout Generation of High-Speed Digital Circuit Using Standard Cells in FinFET

Authors
Kang, TaeseungShin, TaehoKim, HeejunHan, Jaeduk
Issue Date
Jul-2025
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
Digital Circuits; Digital Synthesis; Generator-based Design; Hand-crafted Design; Memory Controller; Standard Cells
Citation
2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD), pp 1 - 4
Pages
4
Indexed
SCOPUS
Journal Title
2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)
Start Page
1
End Page
4
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/208746
DOI
10.1109/SMACD65553.2025.11092209
ISSN
2575-4874
2575-4890
Abstract
This paper presents a generator-based layout design methodology that leverages foundry-standard cells to produce area-efficient and design-rule-check (DRC) clean high-speed custom digital circuits. The proposed approach facilitates guided structural placement and routing based on DRC-clean grids extracted from standard cells, offering enhanced fine-tuning and interactive placement and routing capabilities compared to conventional digital synthesis methods. Unlike previous generator-based layout generation methods, the proposed approach employs area-and power-efficient standard cells, achieving reductions of 77.8% in area and 28.57% in power, respectively, compared to a full-custom design in the identical process node, while maintaining customization capabilities and layout quality.
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