Process-Portable Layout Generation of High-Speed Digital Circuit Using Standard Cells in FinFET
- Authors
- Kang, Taeseung; Shin, Taeho; Kim, Heejun; Han, Jaeduk
- Issue Date
- Jul-2025
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Keywords
- Digital Circuits; Digital Synthesis; Generator-based Design; Hand-crafted Design; Memory Controller; Standard Cells
- Citation
- 2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD), pp 1 - 4
- Pages
- 4
- Indexed
- SCOPUS
- Journal Title
- 2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)
- Start Page
- 1
- End Page
- 4
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/208746
- DOI
- 10.1109/SMACD65553.2025.11092209
- ISSN
- 2575-4874
2575-4890
- Abstract
- This paper presents a generator-based layout design methodology that leverages foundry-standard cells to produce area-efficient and design-rule-check (DRC) clean high-speed custom digital circuits. The proposed approach facilitates guided structural placement and routing based on DRC-clean grids extracted from standard cells, offering enhanced fine-tuning and interactive placement and routing capabilities compared to conventional digital synthesis methods. Unlike previous generator-based layout generation methods, the proposed approach employs area-and power-efficient standard cells, achieving reductions of 77.8% in area and 28.57% in power, respectively, compared to a full-custom design in the identical process node, while maintaining customization capabilities and layout quality.
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