ScholarWorks@Hanyang University: 2. Conference Papers

2. Conference Papers(서울 공과대학 > 서울 산업공학과 > 2. Conference Papers)351

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Collection's Items (Sorted by Submit Date in Descending order): 161 to 180 of 351

Reliability Evaluation in Carbon Nanotubes for Display Devices

ConferenceIssue Date2006PlaceHong Kong

Spatial Modeling of Clustered Defects across a Wafer Map

ConferenceIssue Date2006PlaceHong Kong

Statistical Models for Hot Electron Degradation in Nanoscaled MOSFET Devices

ConferenceIssue Date2006PlaceHong Kong

Hot Electron Degradation in Nano-scaled Devices

ConferenceIssue Date2007PlaceThe Azores

Bi-objective Scheduling for Reentrant Hybrid Flow Shop: Application to a TFT-LCD Manufacturing

ConferenceIssue Date2007PlaceSeattle, USA

change-point trend test for repairable system

ConferenceIssue Date2008Place경기대학교

Lifetime Estimation Based on Accelerated Degradation Data with Application to OLED Reliability Studies

ConferenceIssue Date2009PlaceIncheon

A multi-objective constraint programming for supply chain planning

ConferenceIssue Date2009Place인하대

Reverse Logistics 연구 동향 및 방향

ConferenceIssue Date2009Place서울시정개발연구원

Optimal Degradation Experimental Design in Nonlinear Coefficients Model

ConferenceIssue Date2009

Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diode (OLED) from Accelerated Degradation Test

ConferenceIssue Date2009Place경희대학교

수리가능 시스템의 재발고장 데이터 분석 방법 연구

ConferenceIssue Date2009Place경희대학교

sampling oriented constraint based design for bipolar-plate of vanadium redox flow battery

ConferenceIssue Date2010Place제주도

Direct Methanol Fuel Cell 가속열화 시험 방법

ConferenceIssue Date2010Place아주대학교

A Serial Supply Chain Coordination Problem under Perfect/Partial Information Sharing

ConferenceIssue Date2010PlaceAustin, Texas, USA

Reliability Prediction Using Bayesian Change-Point Approaches

ConferenceIssue Date2010PlaceWellington, New Zealand

A control chart for cluster index to monitor clustered defects in semiconductor manufacturing process

ConferenceIssue Date2010PlaceWellington, New Zealand

Optimal Degradation Testing Plan in Nonlinear Random-Coefficients Model with Cost Function

ConferenceIssue Date2011PlaceCharlotte

Bayesian Modeling of Stochastic Strength for Carbon Nanotubes

ConferenceIssue Date2011PlaceCharlotte

Optimal Maintenance Policy of Repairable System with Bathtub Shpaed Intensity

ConferenceIssue Date2011Place전주

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