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Highly Uniform and Flicker-Free Pixel Circuit for Wide Variable Refresh Rate AMOLED Displays

Authors
Wee, Sung-MinKim, YounsikChung, Kyung-HoonYu, ByungchangLim, JaemyungKwon, Oh-Kyong
Issue Date
Dec-2025
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Fluctuations; Logic gates; Hysteresis; Thin film transistors; Leakage currents; Active matrix organic light emitting diodes; Switches; Current measurement; Threshold voltage; Anodes; AMOLED; VRR; flicker; pixel circuit
Citation
IEEE ELECTRON DEVICE LETTERS, v.46, no.12, pp 2285 - 2288
Pages
4
Indexed
SCIE
SCOPUS
Journal Title
IEEE ELECTRON DEVICE LETTERS
Volume
46
Number
12
Start Page
2285
End Page
2288
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/211749
DOI
10.1109/LED.2025.3617005
ISSN
0741-3106
1558-0563
Abstract
This letter proposes a 9T2C AMOLED pixel circuit that achieves high luminance uniformity and low flicker across a wide variable refresh rate (VRR) range of 15 to 360 Hz using LTPS TFTs. To enhance uniformity, the circuit compensates for threshold voltage (ΔV<inf>TH</inf>) and subthreshold slope (ΔSS) variations of the driving TFT by securing sufficient compensation time and employing a diode-connected current sink method. Flicker is significantly reduced by alleviating the effects of switching TFT leakage current, driving TFT hysteresis, and OLED parasitic capacitance (C<inf>OLED</inf>) through a pulse-referenced method and maximum refresh rate (MRR) driving method. The circuit was fabricated on a 14-inch 4K AMOLED panel and experimentally verified. The measured worst-case spatial emission current errors (SECEs) were +2.8/-2.9 LSB and +0.4/-0.4 LSB at high and low gray levels, respectively. Regarding flicker, the worst temporal errors (TECEs) were measured to -1.7 LSB and +0.3 LSB at high and low gray levels, respectively. © 2025 Elsevier B.V., All rights reserved.
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