Highly Uniform and Flicker-Free Pixel Circuit for Wide Variable Refresh Rate AMOLED Displays
- Authors
- Wee, Sung-Min; Kim, Younsik; Chung, Kyung-Hoon; Yu, Byungchang; Lim, Jaemyung; Kwon, Oh-Kyong
- Issue Date
- Dec-2025
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Fluctuations; Logic gates; Hysteresis; Thin film transistors; Leakage currents; Active matrix organic light emitting diodes; Switches; Current measurement; Threshold voltage; Anodes; AMOLED; VRR; flicker; pixel circuit
- Citation
- IEEE ELECTRON DEVICE LETTERS, v.46, no.12, pp 2285 - 2288
- Pages
- 4
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE ELECTRON DEVICE LETTERS
- Volume
- 46
- Number
- 12
- Start Page
- 2285
- End Page
- 2288
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/211749
- DOI
- 10.1109/LED.2025.3617005
- ISSN
- 0741-3106
1558-0563
- Abstract
- This letter proposes a 9T2C AMOLED pixel circuit that achieves high luminance uniformity and low flicker across a wide variable refresh rate (VRR) range of 15 to 360 Hz using LTPS TFTs. To enhance uniformity, the circuit compensates for threshold voltage (ΔV<inf>TH</inf>) and subthreshold slope (ΔSS) variations of the driving TFT by securing sufficient compensation time and employing a diode-connected current sink method. Flicker is significantly reduced by alleviating the effects of switching TFT leakage current, driving TFT hysteresis, and OLED parasitic capacitance (C<inf>OLED</inf>) through a pulse-referenced method and maximum refresh rate (MRR) driving method. The circuit was fabricated on a 14-inch 4K AMOLED panel and experimentally verified. The measured worst-case spatial emission current errors (SECEs) were +2.8/-2.9 LSB and +0.4/-0.4 LSB at high and low gray levels, respectively. Regarding flicker, the worst temporal errors (TECEs) were measured to -1.7 LSB and +0.3 LSB at high and low gray levels, respectively. © 2025 Elsevier B.V., All rights reserved.
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