Koo, Ryun-Han; Shin, Wonjun; Ryu, Sangwoo; Lee, Kyungmin; Park, Sung-Ho; Im, Jiseong; Ko, Jong-Hyun; Kim, Jeong-Hyun; Kwon, Dongseok; Kim, Jae-Joon, et al.
ArticleIssue Date2023CitationIEEE Electron Device Letters, v.44, no.10, pp 1624 - 1627PublisherInstitute of Electrical and Electronics Engineers Inc.