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Correlation Between Defects and Electrical Properties of Oxide Semiconductor Materials by Photo-Induced Current Transient Spectroscopy
- Authors
- 홍진표
- Issue Date
- 23-Apr-2025
- Place
- 대전 컨벤션센터
- Conference Name
- 2025년 봄 학술논문발표회
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Hong, Jin Pyo
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)