Bridging the p-type gap in oxide electronics with 2D semiconductorsopen access
- Authors
- Kim, Taikyu; Hwang, Seokhyun; Jeong, Jae Kyeong
- Issue Date
- Jul-2026
- Publisher
- SPRINGERNATURE
- Citation
- COMMUNICATIONS ENGINEERING, v.5, no.1, pp 1 - 14
- Pages
- 14
- Indexed
- SCOPUS
ESCI
- Journal Title
- COMMUNICATIONS ENGINEERING
- Volume
- 5
- Number
- 1
- Start Page
- 1
- End Page
- 14
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/219162
- DOI
- 10.1038/s44172-026-00723-3
- ISSN
- 2731-3395
2731-3395
- Abstract
- Monolithic three-dimensional (3D) integration—collocating logic and memory in the back-end-of-line (BEOL)—offers higher bandwidth, lower latency, and improved energy efficiency for AI, cloud, and edge systems. Pairing two-dimensional p-type semiconductors with oxide n-channel transistors establishes a practical basis for complementary BEOL CMOS. This Review assesses manufacturing-aligned pathways to high-performance 2D p-channel transistors, covering transfer-free low-temperature growth, clean van der Waals contacts, gentle p-doping, and mitigation of crystallization, volatility, and interdiffusion. Recent gain-cell and vertical complementary field-effect transistor (CFET) demonstrations are examined, and a pragmatic outlook for BEOL p-type 2D semiconductors is outlined toward manufacturable, dense, low-power monolithic 3D chips.
- Files in This Item
-
Go to Link
- Appears in
Collections - 서울 공과대학 > 서울 융합전자공학부 > 1. Journal Articles

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.