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Bridging the p-type gap in oxide electronics with 2D semiconductorsopen access

Authors
Kim, TaikyuHwang, SeokhyunJeong, Jae Kyeong
Issue Date
Jul-2026
Publisher
SPRINGERNATURE
Citation
COMMUNICATIONS ENGINEERING, v.5, no.1, pp 1 - 14
Pages
14
Indexed
SCOPUS
ESCI
Journal Title
COMMUNICATIONS ENGINEERING
Volume
5
Number
1
Start Page
1
End Page
14
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/219162
DOI
10.1038/s44172-026-00723-3
ISSN
2731-3395
2731-3395
Abstract
Monolithic three-dimensional (3D) integration—collocating logic and memory in the back-end-of-line (BEOL)—offers higher bandwidth, lower latency, and improved energy efficiency for AI, cloud, and edge systems. Pairing two-dimensional p-type semiconductors with oxide n-channel transistors establishes a practical basis for complementary BEOL CMOS. This Review assesses manufacturing-aligned pathways to high-performance 2D p-channel transistors, covering transfer-free low-temperature growth, clean van der Waals contacts, gentle p-doping, and mitigation of crystallization, volatility, and interdiffusion. Recent gain-cell and vertical complementary field-effect transistor (CFET) demonstrations are examined, and a pragmatic outlook for BEOL p-type 2D semiconductors is outlined toward manufacturable, dense, low-power monolithic 3D chips.
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Jeong, Jae Kyeong
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
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