ScholarWorks@Hanyang University: 2. Conference Papers

2. Conference Papers(서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers)2,853

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Collection's Items (Sorted by Submit Date in Descending order): 2421 to 2440 of 2853

Dependency of CBRAM performance on fab-friendly solid electrolyte material (TiO2, HfO2, Ta2O5, ZrO2, Al2O3, and SiO2)

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ConferenceIssue Date2016PlaceSUMCO Kyushu Factory (Imari)

Enhanced color performance of quantum-dot LCD by utilizing inorganic CsPbBr3-xIX perovskite quantum-dots

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ConferenceIssue Date2016PlaceSUMCO Kyushu Factory (Imari)

High Speed Serial Link 구성에 따른 Hybrid Memory Cube의 성능 분석

정기석

ConferenceIssue Date2016Place서울

Surface Plasmon-enhanced Electroluminescence due to the Incorporation of the Au-WO3 Nanocomposite Layer in Organic Light-emitting Devices

김태환

ConferenceIssue Date2016CitationThe 4th International Conference on Electronic Materials and Nanotechnology for Green EnvironmentPublisherThe Korean Institue of Metals and MaterialsPlaceJeju, KOREA

Effects of the single grain boundary on the electrical characteristics in 3D V-NAND flash memory devices

김태환

ConferenceIssue Date2016CitationThe 14th International Conference on Nano Science and Nano TechnologyPublisherMokpo National UniversityPlaceMokpo National University

Effect of thermal annealing on the electrical characteristics of gate-all-around transistors

김태환

ConferenceIssue Date2016CitationThe 14th International Conference on Nano Science and Nano TechnologyPublisherMokpo National UniversityPlaceMokpo National University

Impact of the curvature radius of edge stress on the electrical characteristics of FinFETs

김태환

ConferenceIssue Date2016CitationThe 14th International Conference on Nano Science and Nano TechnologyPublisherMokpo National UniversityPlaceMokpo National University

Change Characteristics of the CB-RAM According to the Thickness of HfOx Insulator and Heat Treatment Temperature

박재근

ConferenceIssue Date2016Place경주 현대호텔

Study of Etching Rate according to the Type of Oxidizers and Concentration of Each Oxidizer in Tungsten CMP

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ConferenceIssue Date2016Place경주 현대호텔

Performance and Reliability of InGaZnO (IGZO) based Conductive Bridge Random Access Memory

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