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Electrical Reponses of TaOx-Based RRAM Device to Neuromorphic Characteristics
- Authors
- 최창환
- Issue Date
- 20-Nov-2017
- Place
- 나라, 일본
- Conference Name
- International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - Science and Technology -
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Collections - 서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers
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Related Researcher
- Choi, Chang hwan
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)