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A simulation model for reliability prediction of progressive breakdown in ultra-thin gate oxides
- Authors
- 배석주
- Issue Date
- 7-Nov-2015
- Place
- 서울 연세대학교
- Conference Name
- EAWIE 2015
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Collections - 서울 공과대학 > 서울 산업공학과 > 2. Conference Papers
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Related Researcher
- Bae, Suk Joo
- COLLEGE OF ENGINEERING (DEPARTMENT OF INDUSTRIAL ENGINEERING)