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작은 샘플 크기의 one-shot device를 위한 베이지안 신뢰도 추정
- Authors
- 배석주
- Issue Date
- 23-Nov-2012
- Publisher
- 한국신뢰성학회
- Citation
- 추계 신뢰성학회
- Conference Name
- 추계 신뢰성학회
- Place
- 한국뉴욕주립대학교
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Collections - 서울 공과대학 > 서울 산업공학과 > 2. Conference Papers
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Related Researcher
- Bae, Suk Joo
- COLLEGE OF ENGINEERING (DEPARTMENT OF INDUSTRIAL ENGINEERING)