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Special Analysis of The Nanotopography Effect on Oxide CMP Using Improved Single-Side-Polished Si Wafer
- Authors
- 전형탁
- Issue Date
- 20020419
- Place
- 부산 백스코
- Conference Name
- 한국물리학회 봄학술논문발표회
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Collections - 서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers
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Related Researcher
- Jeon, Hyeongtag
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)