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Radiation hardness evaluation of GaN-based transistors by particle-beam irradiation
- Authors
- Keum, Dongmin; D.; Kim, Hyungtak; H.
- Issue Date
- 2017
- Citation
- Transactions of the Korean Institute of Electrical Engineers, v.66, no.9, pp.1351 - 1358
- Journal Title
- Transactions of the Korean Institute of Electrical Engineers
- Volume
- 66
- Number
- 9
- Start Page
- 1351
- End Page
- 1358
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Related Researcher
- Kim, Hyung tak
- Engineering (Electronic & Electrical Engineering)