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Characterization of Stiffness Constants of Silicon versus Temperature Using “Poisson’s ratio Measurements
- Authors
- 조준형
- Issue Date
- Jul-2015
- Publisher
- IEEK, IEICE
- Citation
- Proceedings of 2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices, v.1, no.1, pp.346 - 351
- Journal Title
- Proceedings of 2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices
- Volume
- 1
- Number
- 1
- Start Page
- 346
- End Page
- 351
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Related Researcher
- Cho, Chun Hyung
- Science & Technology (Department of Electronic & Electrical Convergence Engineering)