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Point defects and related properties of highly co-doped bixbyite In2O3

Authors
Mason, TOGonzalez, GBHwang, JHKammler, DR
Issue Date
2003
Publisher
ROYAL SOC CHEMISTRY
Citation
PHYSICAL CHEMISTRY CHEMICAL PHYSICS, v.5, no.11, pp.2183 - 2189
Journal Title
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
Volume
5
Number
11
Start Page
2183
End Page
2189
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/26648
DOI
10.1039/b300171g
ISSN
1463-9076
Abstract
The method of co-doping has been employed to achieve and study the influence of high defect populations in bixbyite In2O3. Substantial metastable Sn-doping levels can be achieved in nanocrystalline In2O3 with associated co-doping by oxygen interstitials. The resulting electrical properties, diffraction data (X-ray and neutron), and EXAFS studies support the presence of 2 : 1 Sn-oxygen interstitial point defect clusters. Upon reduction, some of these clusters can be reduced to liberate donors and generate charge carriers. Extensive Cd/Sn co-substitution for indium in In2O3 has been achieved in equilibrium solid solutions. This self-compensated (isovalent) and relatively size-matched substitution reveals a tendency for off-stoichiometry in favor of donors, resulting in "self-doped'' behavior irrespective of oxygen partial pressure. Rami. cations of bixbyite defect structure for transparent electrode applications are discussed.
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