5 GHz all-digital delay-locked loop for future memory systems beyond double data rate 4 synchronous dynamic random access memory
- Authors
- Lee, Dongyeol; Kim, Jongsun
- Issue Date
- 19-Nov-2015
- Publisher
- INST ENGINEERING TECHNOLOGY-IET
- Keywords
- random-access storage; time-digital conversion; search problems; clocks; CMOS memory circuits; timing jitter; synchronisation; low-power electronics; memory systems; synchronous dynamic random access memory; all-digital delay-locked loop; low-power DLL; fast-locking DLL; time-to-digital converter; hybrid search algorithm; TDC search algorithm; binary search algorithm; sequential search algorithm; clock cycles; harmonic lock problems; intrinsic delay; digital delay line; CMOS process; peak-to-peak output clock jitter; p-p output clock jitter; frequency 1; 5 GHz to 5; 0 GHz; size 65 nm; power 6; 9 mW; voltage 1 V; size 0; 025 mm
- Citation
- ELECTRONICS LETTERS, v.51, no.24, pp.1973 - 1974
- Journal Title
- ELECTRONICS LETTERS
- Volume
- 51
- Number
- 24
- Start Page
- 1973
- End Page
- 1974
- URI
- https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/9009
- DOI
- 10.1049/el.2015.2876
- ISSN
- 0013-5194
- Abstract
- A new low-power, fast-locking, all-digital delay-locked loop (DLL) that uses a disposable time-to-digital converter (TDC) is presented for future memory systems beyond double data rate 4. To achieve fast locking and high-frequency operation, the proposed DLL utilises a new hybrid (TDC + binary + sequential) search algorithm that results in a fast locking time of 11 clock cycles without the false lock and harmonic lock problems. By minimising the intrinsic delay of the digital delay line, the proposed DLL achieves an operating frequency range of 1.5-5.0 GHz which is higher than that of the current state-of-the-art all-digital DLLs. The DLL is fabricated in a 65 nm CMOS process and it achieves a peak-to-peak (p-p) output clock jitter of 14 ps (with a p-p input clock jitter of 8 ps) at 5 GHz. The DLL consumes 6.9 mW at 1 V and occupies an active area of 0.025 mm(2).
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Collections - College of Engineering > School of Electronic & Electrical Engineering > 1. Journal Articles
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