Huynh, H.A.[Huynh, H.A.]; Jo, J.-M.[ Jo, J.-M.]; Nah, W.[Nah, W.]; Kim, S.[Kim, S.]
ArticleIssue Date2016CitationIEEE Transactions on Electromagnetic Compatibility, v.58, no.5, pp.1629 - 1641PublisherInstitute of Electrical and Electronics Engineers Inc.