Le, H.K.[Le, H.K.]; Van, Nguyen H.[Van, Nguyen H.]; Han, Y.[Han, Y.]; Kim, S.[Kim, S.]
ArticleIssue Date2021CitationIEEE Transactions on Electromagnetic Compatibility, v.63, no.6, pp.2105 - 2114PublisherInstitute of Electrical and Electronics Engineers Inc.