X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates
DC Field | Value | Language |
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dc.contributor.author | Budai, JD | - |
dc.contributor.author | Yang, WG | - |
dc.contributor.author | Tamura, N | - |
dc.contributor.author | Chung, JS | - |
dc.contributor.author | Tischler, JZ | - |
dc.contributor.author | Larson, BC | - |
dc.contributor.author | Ice, GE | - |
dc.contributor.author | Park, C | - |
dc.contributor.author | Norton, DP | - |
dc.date.available | 2018-05-10T18:32:35Z | - |
dc.date.created | 2018-04-17 | - |
dc.date.issued | 2003-07 | - |
dc.identifier.issn | 1476-1122 | - |
dc.identifier.uri | http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/20716 | - |
dc.description.abstract | The crystallographic texture of thin-film coatings plays an essential role in determining such diverse materials properties as wear resistance, recording density in magnetic media and electrical transport in superconductors. Typically, X-ray pole figures provide a macroscopically averaged description of texture, and electron backscattering provides spatially resolved surface measurements. In this study, we have used focused, polychromatic synchrotron X-ray microbeams to penetrate multilayer materials and simultaneously characterize the local structure, orientation and strain tensor of different heteroepitaxial layers with submicrometre resolution. Grain-by-grain microstructural studies of cerium oxide films grown on textured nickel foils reveal two distinct kinetic growth regimes on vicinal surfaces: ledge growth at elevated temperatures and island growth at lower temperatures. In addition, a combinatorial approach reveals that crystallographic tilting associated with these complex interfaces is qualitatively described by a simple geometrical model applicable to brittle films on ductile substrates. The sensitivity of conducting percolation paths to tilt-induced texture improvement is demonstrated. | - |
dc.publisher | NATURE PUBLISHING GROUP | - |
dc.relation.isPartOf | NATURE MATERIALS | - |
dc.subject | YBA2CU3O7-DELTA COATED CONDUCTORS | - |
dc.subject | CRITICAL-CURRENT DENSITY | - |
dc.subject | SUPERCONDUCTING TAPES | - |
dc.subject | EPITAXIAL YBA2CU3O7 | - |
dc.subject | CRITICAL CURRENTS | - |
dc.subject | THIN-FILMS | - |
dc.subject | LAYERS | - |
dc.subject | STRAIN | - |
dc.subject | RESOLUTION | - |
dc.subject | HETEROEPITAXY | - |
dc.title | X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates | - |
dc.type | Article | - |
dc.identifier.doi | 10.1038/nmat916 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | NATURE MATERIALS, v.2, no.7, pp.487 - 492 | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000183892200025 | - |
dc.identifier.scopusid | 2-s2.0-0043267489 | - |
dc.citation.endPage | 492 | - |
dc.citation.number | 7 | - |
dc.citation.startPage | 487 | - |
dc.citation.title | NATURE MATERIALS | - |
dc.citation.volume | 2 | - |
dc.contributor.affiliatedAuthor | Chung, JS | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | YBA2CU3O7-DELTA COATED CONDUCTORS | - |
dc.subject.keywordPlus | CRITICAL-CURRENT DENSITY | - |
dc.subject.keywordPlus | SUPERCONDUCTING TAPES | - |
dc.subject.keywordPlus | EPITAXIAL YBA2CU3O7 | - |
dc.subject.keywordPlus | CRITICAL CURRENTS | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | LAYERS | - |
dc.subject.keywordPlus | STRAIN | - |
dc.subject.keywordPlus | RESOLUTION | - |
dc.subject.keywordPlus | HETEROEPITAXY | - |
dc.description.journalRegisteredClass | scopus | - |
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