X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates
- Authors
- Budai, JD; Yang, WG; Tamura, N; Chung, JS; Tischler, JZ; Larson, BC; Ice, GE; Park, C; Norton, DP
- Issue Date
- Jul-2003
- Publisher
- NATURE PUBLISHING GROUP
- Citation
- NATURE MATERIALS, v.2, no.7, pp.487 - 492
- Journal Title
- NATURE MATERIALS
- Volume
- 2
- Number
- 7
- Start Page
- 487
- End Page
- 492
- URI
- http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/20716
- DOI
- 10.1038/nmat916
- ISSN
- 1476-1122
- Abstract
- The crystallographic texture of thin-film coatings plays an essential role in determining such diverse materials properties as wear resistance, recording density in magnetic media and electrical transport in superconductors. Typically, X-ray pole figures provide a macroscopically averaged description of texture, and electron backscattering provides spatially resolved surface measurements. In this study, we have used focused, polychromatic synchrotron X-ray microbeams to penetrate multilayer materials and simultaneously characterize the local structure, orientation and strain tensor of different heteroepitaxial layers with submicrometre resolution. Grain-by-grain microstructural studies of cerium oxide films grown on textured nickel foils reveal two distinct kinetic growth regimes on vicinal surfaces: ledge growth at elevated temperatures and island growth at lower temperatures. In addition, a combinatorial approach reveals that crystallographic tilting associated with these complex interfaces is qualitatively described by a simple geometrical model applicable to brittle films on ductile substrates. The sensitivity of conducting percolation paths to tilt-induced texture improvement is demonstrated.
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Collections - College of Natural Sciences > Department of Physics > 1. Journal Articles
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