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Direct measurements of multi-photon induced nonlinear lattice dynamics in semiconductors via time-resolved x-ray scatteringGo to Link

Williams, G.J.; Lee, S.; Walko, D.A.; Watson, M.A.; Jo, W.; Lee, D.R.; Landahl, E.C.

ArticleIssue Date2016CitationScientific Reports, v.6PublisherNature Publishing Group
Attitudes toward rape - A comparison between Asian and Caucasian college students

Lee, J; Pomeroy, EC; Yoo, SK; Rheinboldt, KT

ArticleIssue Date2005CitationVIOLENCE AGAINST WOMEN, v.11, no.2, pp.177 - 196PublisherSAGE PUBLICATIONS INC
Development of a pH-independent Post-CMP Cleaning Solution using Phosphoric Acid-based Surfactants for Removal of Ceria NanoparticlesGo to Link

Myong, Kyong Kyu; Byun, Jinuk; Lee, Jiseok; Lim, Taeho; Kim, Jae Jeong

ArticleIssue Date2023CitationECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.12, no.7PublisherELECTROCHEMICAL SOC INC
Effect of complexing agents on surface composition for co post-CMP cleaning process

Byun, J.; Bae, K.; Kwon, O.; Myong, K.K.; Lim, T.; Kim, J.J.

ArticleIssue Date2021CitationECS Journal of Solid State Science and Technology, v.10, no.2PublisherIOP Publishing Ltd
후방카메라모듈의 system level 불량분석을 위한 ESD 예측해석기술에 관한 연구

서철헌; 김양현

ArticleIssue Date2020Citation전자공학회논문지, v.57, no.9, pp.19 - 25Publisher대한전자공학회
Fast Three-Material Modeling With Triple Arch Projection for Electronic Cleansing in CTC

Lee, Hyunna; Lee, Jeongjin; Kim, Bohyoung; Kim, Se Hyung; Shin, Yeong-Gil

ArticleIssue Date2014CitationIEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING, v.61, no.7, pp.2102 - 2111PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Characterization of cell death in Escherichia coli mediated by XseA, a large subunit of exonuclease VII

Jung, Hyeim; Liang, Junwei; Jung, Yuna; Lim, Dongbin

ArticleIssue Date2015CitationJOURNAL OF MICROBIOLOGY, v.53, no.12, pp.820 - 828PublisherMICROBIOLOGICAL SOCIETY KOREA
Toward a Unified Framework for Cognitive Maps

Kim, Woori; Yoo, Yongseok

ArticleIssue Date2020CitationNEURAL COMPUTATION, v.32, no.12, pp.2405 - 2435PublisherMIT PRESS
전자기 수치해석을 이용한 표준보정시험편의 배열형 와전류 탐촉자 신호 특성 해석

김지호; 이향범

ArticleIssue Date2010Citation비파괴검사학회지, v.30, no.4, pp.330 - 337Publisher한국비파괴검사학회
배열 와전류 프로브의 FBH 결함 크기 변화에 따른 신호 해석

김지호; 임건규; 이향범

ArticleIssue Date2009Citation비파괴검사학회지, v.29, no.2, pp.137 - 144Publisher한국비파괴검사학회
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