CAU Scholar's Space: Search

Results 1-10 of 1,059 (Search time: 0.018 seconds).

Plasma-induced damage in PZT thin films etched by inductively coupled plasma

Kang, MG; Kim, KT; Kim, CI

ArticleIssue Date2003CitationTHIN SOLID FILMS, v.435, no.1-2, pp 222 - 226PublisherELSEVIER SCIENCE SA

Sliding-DFT를 이용한 다채널 위상 측정 FPGA 시스템

어진우; 장태규

ArticleIssue Date2004Citation전기전자학회논문지, v.8, no.1, pp 128 - 135Publisher한국전기전자학회

Fiber optic voltage sensor based on the photoelastic effect in a single-mode optical fiber

Kim, H; Jun, J

ArticleIssue Date2000CitationOPTICAL ENGINEERING, v.39, no.12, pp 3281 - 3284PublisherSPIE-INT SOCIETY OPTICAL ENGINEERING

QFP 패키지의 새로운 고주파 등가 회로 모델

김성종; 송상헌

ArticleIssue Date2005Citation전기학회논문지 C권, v.54, no.7(C), pp 339 - 342Publisher대한전기학회

Large remanent polarization of cerium-modified bismuth-titanate thin films for ferroelectric random access memories

Kim, K.T.; Kim, C.I.; Kang, D.H.; Shim, I.W.

ArticleIssue Date2003CitationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.21, no.4, pp 1376 - 1380PublisherA V S AMER INST PHYSICS

Cold- and hot-switching lifetime characterizations of ohmic-contact RF MEMS switches

Kim, Jong-Man; Lee, Sanghyo; Baek, Chang-Wook; Kwon, Youngwoo; Kim, Yong-Kweon

ArticleIssue Date2008CitationIEICE ELECTRONICS EXPRESS, v.5, no.11, pp 418 - 423PublisherIEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG

릿지 형태 CPW 진행파형 구조의 등가회로 분석

윤상준; 최영완; 옥성해; 공순철; 윤영설; 구민주; 박상현

ArticleIssue Date2004Citation전자공학회논문지 - SD, v.41, no.03, pp 219 - 228Publisher대한전자공학회

Adaptive power controllable retrodirective array system for wireless sensor server applications

Lim, Sungjoon; Leong, KMKH; Itoh, T

ArticleIssue Date2005CitationIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.53, no.12, pp 3735 - 3743PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Efficient body-of-revolution (BOR) FDTD solver applied to the analysis and synthesis of focusing and EBG antennas

Rolland, A.; Tong, M.-S.; Sauleau, R.; Nguyen, N.T.; Drissi, M.

ArticleIssue Date2007CitationIET Seminar Digest, v.2007, no.11961

Electromigration characteristics in dual-damascene copper interconnects by difference of via structures

Kim, Nam-Hoon; Kim, Sang-Yong; Lee, Woo-Sun; Chang, Eui-Goo

ArticleIssue Date2007CitationMICROELECTRONIC ENGINEERING, v.84, no.11, pp 2663 - 2668PublisherELSEVIER SCIENCE BV

1 2 3 4 next 106

Discover

STATISTICS: Total View :7,564,055; Today View :11,643

RSS_1.0 RSS_2.0 ATOM_1.0

84, Heukseok-ro, Dongjak-gu, Seoul, Republic of Korea (06974)02-820-6194

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

Discover

Author

Subject

Date Issued

Type

Language

Journal

BROWSE