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Dual-Gate Multiple-Channel ZnO Nanowire Transistors

Authors
Kim, Dong-JooHyung, Jung-HwanSeo, Deok-WonSuh, Duk-IlLee, Sang-Kwon
Issue Date
May-2010
Publisher
SPRINGER
Keywords
ZnO; nanowire; field-effect transistor; alternating-current dielectrophoresis; surface passivation
Citation
JOURNAL OF ELECTRONIC MATERIALS, v.39, no.5, pp 563 - 567
Pages
5
Journal Title
JOURNAL OF ELECTRONIC MATERIALS
Volume
39
Number
5
Start Page
563
End Page
567
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/55280
DOI
10.1007/s11664-009-0984-z
ISSN
0361-5235
1543-186X
Abstract
We report on conventional multichannel ZnO nanowire field-effect transistors (FETs) operating in one device in a dual-gate mode. Our FETs were prepared by assembling ZnO nanowires on a Si substrate using an optimized dielectrophoresis technique with bottom-gate and top-gate FET structures. We observed that the enhancement of the electrical characteristics in FETs with top-gate mode operation results from a thinner gate oxide and top-gate geometry compared with FETs with bottom-gate mode operation. It was also verified that surface passivation strongly affected the electrical performance of ZnO nanowire FETs.
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