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Effects of heat dissipation on unipolar resistance switching in Pt/NiO/Pt capacitorsopen access

Authors
Chang, S.H.Chae, S.C.Lee, S.B.Liu, C.Noh, T.W.Lee, J.S.Kahng, B.Jang, J.H.Kim, M.Y.Kim, D.-W.Jung, C.U.
Issue Date
May-2008
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.92, no.18
Journal Title
APPLIED PHYSICS LETTERS
Volume
92
Number
18
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/56658
DOI
10.1063/1.2924304
ISSN
0003-6951
1077-3118
Abstract
We fabricated Pt/NiO/Pt capacitor structures with various bottom electrode thicknesses t(BE) and investigated their resistance switching behaviors. The capacitors with t(BE)>= 50 nm exhibited typical unipolar resistance memory switching, while those with t(BE)<= 30 nm showed threshold switching. This interesting phenomenon can be explained in terms of the temperature-dependent stability of conducting filaments. In particular, the thinner tBE makes dissipation of Joule heat less efficient, so the filaments will be at a higher temperature and become less stable. This study demonstrates the importance of heat dissipation in resistance random access memory. (C) 2008 American Institute Of Physics.
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Chang, Seo Hyoung
자연과학대학 (물리학과)
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