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Time-dependent current-voltage curves during the forming process in unipolar resistance switching

Authors
Lee, S. B.Yoo, H. K.Chang, Seo HyoungGao, L. G.Kang, B. S.Lee, M. -J.Kim, C. J.Noh, T. W.
Issue Date
Jan-2011
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.98, no.5
Journal Title
APPLIED PHYSICS LETTERS
Volume
98
Number
5
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/56872
DOI
10.1063/1.3552676
ISSN
0003-6951
1077-3118
Abstract
We investigated the time-dependent current-voltage curves of the forming process in unipolar resistance switching. We applied triggered-voltage triangular-waveform (pulse-waveform) signals with varied sweep rate (amplitude) to Pt/SrTiOx/Pt capacitors. By investigating their temperature dependences, we found that the forming process was driven by two different mechanisms, depending on the sweep rate (amplitude) : a purely electrical dielectric breakdown and a thermally assisted dielectric breakdown. For the latter process, we observed precursory changes in the current I(t) before the forming process. By fitting the time-dependent precursory changes with I(t) = I-o -A exp (-t/tau), we suggest that the thermally activated migration of oxygen vacancies/ions could help the thermally assisted dielectric breakdown. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3552676]
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