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SCIESCOPUS
Designing ad-hoc scrubbing sequences to improve memory reliability against soft errorsGo to Link

Reviriego, Pedro; Maestro, Juan Antonio; Baeg, Sanghyeon

ArticleIssue Date2011CitationProceedings - Design Automation Conference, pp 700 - 705PublisherInstitute of Electrical and Electronics Engineers Inc.
SCOPUS
Memory reliability model for accumulated and clustered soft errorsGo to Link

Lee, Soonyoung; Baeg, Sanghyeon; Reviriego, Pedro

ArticleIssue Date2010CitationIEEE International Integrated Reliability Workshop Final Report, pp 114 - 117PublisherIEEE
SCISCIESCOPUS
Memory Reliability Model for Accumulated and Clustered Soft ErrorsGo to Link

Lee, Soonyoung; Baeg, Sanghyeon; Reviriego, Pedro

ArticleIssue Date2011CitationIEEE Transactions on Nuclear Science, v.58, no.5, pp 2483 - 2492PublisherInstitute of Electrical and Electronics Engineers
SCIESCOPUS
Mitigating the Effects of Large Multiple Cell Upsets (MCUs) in MemoriesGo to Link

Antonio Maestro, Juan; Reviriego, Pedro; Baeg, Sanghyeon; Wen, Shijie; Wong, Richard

ArticleIssue Date2011CitationACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, v.16, no.4, pp 1 - 10PublisherASSOC COMPUTING MACHINERY
SCIESCOPUS
Optimizing Scrubbing Sequences for Advanced Computer MemoriesGo to Link

Reviriego, Pedro; Antonio Maestro, Juan; Baeg, Sanghyeon

ArticleIssue Date2010CitationIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v.10, no.2, pp 192 - 200PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCISCIESCOPUS
Protection of Memories Suffering MCUs Through the Selection of the Optimal Interleaving DistanceGo to Link

Reviriego, Pedro; Antonio Maestro, Juan; Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard

ArticleIssue Date2010CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.57, no.4, pp 2124 - 2128PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCOPUS
Selection of the optimal interleaving distance for memories suffering MCUsGo to Link

Reviriego, Pedro; Maestro, Juan Antonio; Baeg, Sanghyeon; Wen, Shijie; Wong, Richard

ArticleIssue Date2009Citation10th European Conference on Radiation Effects on Components and Systems, pp 1 - 4PublisherIEEE
SCIESCOPUS
Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplicationGo to Link

Maestro, Juan Antonio; Reviriego, Pedro; Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard

ArticleIssue Date2013CitationMICROPROCESSORS AND MICROSYSTEMS, v.37, no.8, pp 1103 - 1107PublisherELSEVIER
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