Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
GaN HEMT 공정의 온도 센서를 이용한 주변 온도에 따른 전류 변화량 측정
- Authors
- 김정현
- Issue Date
- 8-Feb-2023
- Place
- 용평리조트
- Conference Name
- 2023년 한국통신학회 동계종합학술발표회
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- KIM, JUNG HYUN
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)