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Influence of current aging on the characteristics of Near-Ultraviolet LEDs

Authors
Choi, Hyo-ShikShim, Jong-InChoi, Won-Jin
Issue Date
Jan-2016
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015, v.2, pp 1 - 2
Pages
2
Indexed
SCOPUS
Journal Title
2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
Volume
2
Start Page
1
End Page
2
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/15980
DOI
10.1109/CLEOPR.2015.7376077
Abstract
We analyzed the influence of a current aging on 380 nm band near-ultraviolet light-emitting diodes with different current densities. Aging have been carried out on LEDs with current densities of 5, 35 and 50 A/cm2 at room temperature for 1000 h. After stressed, both optical and electrical characteristics of LEDS are getting worse as increasing aging current density. We suggest that the possible degradation mechanism of characteristics is increase of the non-radiative (NR) recombination of LEDs due to generation of NR recombination centers in active regions after a current aging. © 2015 IEEE.
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