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Low-frequency noise characteristics of InGaN-based light-emitting diodes

Authors
Oh, Chan-HyoungHan, Dong-PyoShin, Dong SooShim, Jong In
Issue Date
Jan-2016
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015, v.2, pp.1 - 2
Indexed
SCOPUS
Journal Title
2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
Volume
2
Start Page
1
End Page
2
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/15982
DOI
10.1109/CLEOPR.2015.7376075
Abstract
We investigate the low-frequency noise characteristics of InGaN-based light-emitting diodes with different forward leakage currents. It is found that the low-frequency noise characteristics are closely correlated with the forward leakage current. © 2015 IEEE.
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF PHOTONICS AND NANOELECTRONICS > 1. Journal Articles

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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)
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