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Triangular Ferroelectric Domains of Highly (111)-oriented NaNbO3 Thin Film on a Glass Substrate

Authors
Kim, Woo-HeeSon, Jong Yeog
Issue Date
Jan-2014
Publisher
대한금속·재료학회
Keywords
ferroelectric domain wall energy; ferroelectric polarization; piezoelectric force microscopy; pulsed laser deposition
Citation
Electronic Materials Letters, v.10, no.1, pp.107 - 110
Indexed
SCIE
SCOPUS
KCI
Journal Title
Electronic Materials Letters
Volume
10
Number
1
Start Page
107
End Page
110
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/24090
DOI
10.1007/s13391-013-3120-4
ISSN
1738-8090
Abstract
Highly (111)-oriented polycrystalline NaNbO3 (NNO) thin films were deposited on Pt/Ta/glass substrates by pulsed laser deposition. To obtain a well-crystallized Pt bottom electrode on glass substrates, Ta buffer layers were employed between Pt bottom electrodes and glass substrates. The NNO thin film exhibited good ferroelectricity with high remanent polarization (2P r ≈ 46 μC/cm2) and leakage current density (∼2 × 10-6 A/cm2 at 500 kV/cm). Based on a piezoelectric force microscope study, it is demonstrated that the NNO thin film with triangular grains has ferroelectric domain wall energy slightly less than PbTiO3 thin films. © 2014 The Korean Institute of Metals and Materials and Springer Science+Business Media Dordrecht.
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Kim, Woo Hee
ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)
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