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Impedance spectroscopy of resistance switching in a Pt/NiO/Pt capacitor

Authors
Na, Sang-ChulChun, Min ChulKim, Jae-JunShon, JungwookJo, SunkakKim, HyunjinKang, Bo Soo
Issue Date
Dec-2013
Publisher
KOREAN PHYSICAL SOC
Keywords
Resistance switching; Impedance spectroscopy; NiO thin film
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.63, no.12, pp.2277 - 2280
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume
63
Number
12
Start Page
2277
End Page
2280
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/26286
DOI
10.3938/jkps.63.2277
ISSN
0374-4884
Abstract
A unipolar resistance switching (URS) Pt/NiO/Pt thin film structure was successfully deposited by sputtering. Each state was analyzed by using impedance spectroscopy. The equivalent circuit of the pristine state consists of resistor-capacitor parallel circuit. The low-resistance state could be described by using a single resistor. The high-resistance state comprised parallelly-connected resistor and constant-phase element, plus a serial inductor. Our results are in good agreement with a model for the formation/rupture of conducting filaments in the URS phenomenon.
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