Impedance spectroscopy of resistance switching in a Pt/NiO/Pt capacitor
- Authors
- Na, Sang-Chul; Chun, Min Chul; Kim, Jae-Jun; Shon, Jungwook; Jo, Sunkak; Kim, Hyunjin; Kang, Bo Soo
- Issue Date
- Dec-2013
- Publisher
- KOREAN PHYSICAL SOC
- Keywords
- Resistance switching; Impedance spectroscopy; NiO thin film
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.63, no.12, pp.2277 - 2280
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY
- Volume
- 63
- Number
- 12
- Start Page
- 2277
- End Page
- 2280
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/26286
- DOI
- 10.3938/jkps.63.2277
- ISSN
- 0374-4884
- Abstract
- A unipolar resistance switching (URS) Pt/NiO/Pt thin film structure was successfully deposited by sputtering. Each state was analyzed by using impedance spectroscopy. The equivalent circuit of the pristine state consists of resistor-capacitor parallel circuit. The low-resistance state could be described by using a single resistor. The high-resistance state comprised parallelly-connected resistor and constant-phase element, plus a serial inductor. Our results are in good agreement with a model for the formation/rupture of conducting filaments in the URS phenomenon.
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