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Three-Dimensional Analysis of Temperature Distributions Based on Circuit Modeling of Light-Emitting Diodes

Authors
Yun, JoosunHan, Dong-PyoShim, Jong-InShin, Dong-Soo
Issue Date
Jun-2012
Publisher
Institute of Electrical and Electronics Engineers
Keywords
Circuit modeling; light-emitting diodes (LEDs); temperature distribution
Citation
IEEE Transactions on Electron Devices, v.59, no.6, pp.1799 - 1802
Indexed
SCIE
SCOPUS
Journal Title
IEEE Transactions on Electron Devices
Volume
59
Number
6
Start Page
1799
End Page
1802
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/32672
DOI
10.1109/TED.2012.2189571
ISSN
0018-9383
Abstract
Thermal circuit modeling is successfully established and utilized for analyzing the temperature distribution within each epitaxial film of InGaN/GaN multiple-quantum-well blue light-emitting diodes (LEDs). The temperature distribution based on the infrared (IR) intensity from the LED surface is also calculated by applying the known emissivity and transmittance values for each epitaxial material to the simulated results. We measure the temperature distribution by using an IR camera on the LED surface and demonstrate that the simulated and measured temperature distributions have very similar distribution tendencies.
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