Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Noise Characteristics of Charge Tunneling via Localized States in Metal-Molecule-Metal Junctions
- Issue Date
- Aug-2010
- Publisher
- American Chemical Society
- Keywords
- molecular junctions; localized states; 1/f noise; random telegraph noise; shot noise
- Citation
- ACS Nano, v.4, no.8, pp.4426 - 4430
- Indexed
- SCIE
SCOPUS
- Journal Title
- ACS Nano
- Volume
- 4
- Number
- 8
- Start Page
- 4426
- End Page
- 4430
- ISSN
- 1936-0851
- Abstract
- We report the noise characteristics of charge transport through an alkyl-based metal-molecule-metal junction. Measurements of the 1/f noise, random telegraph noise, and shot noise demonstrated the existence of localized traps in the molecular junctions. These three noise measurements exhibited results consistent with trap-mediated tunneling activated over similar to 0.4 V by trapping and detrapping processes via localized states (or defects). The noise characterizations will be useful in evaluating the influences of localized states on charge transport in molecular or other electronic junctions.
- Files in This Item
- Go to Link
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Jeong, Hee jun
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF APPLIED PHYSICS)