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Ni-catalyzed growth of silicon wire arrays for a Schottky diode

Authors
Jee, Sang-WonKim, JoondongJung, Jin-YoungUm, Han-DonMoiz, Syed AbdulYoo, BongyoungCho, Hyung KounPark, Yun ChangLee, Jung-Ho
Issue Date
Jul-2010
Publisher
American Institute of Physics
Keywords
arrays; catalysis; elemental semiconductors; leakage currents; nickel; rectification; Schottky barriers; Schottky diodes; semiconductor growth; silicon
Citation
Applied Physics Letters, v.97, no.4, pp.1 - 3
Indexed
SCIE
SCOPUS
Journal Title
Applied Physics Letters
Volume
97
Number
4
Start Page
1
End Page
3
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/39630
DOI
10.1063/1.3467839
ISSN
0003-6951
Abstract
Vertically grown Si wire arrays were fabricated on a large scale by the Ni-catalyzed vapor-liquid-solid method. A single Si wire has a length of several tens of micrometers with a pure Si stem and a NiSi2 tip. The NiSi2 tip was spontaneously formed on a Si wire due to a slight lattice mismatch relative to Si. Further, this system provides a Schottky contact having a rectifying ratio of similar to 10(2) with a low leakage current of about 2.88 x 10(-10) A. The growth mechanism of vertical Si wires and the performance of a Schottky diode are discussed. (C) 2010 American Institute of Physics. [doi:10.1063/1.3467839]
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Lee, Jung-Ho
ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)
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