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Extreme-ultraviolet pellicle durability comparison for better lifetime

Authors
Shin, H.-G.Oh, H.-K.
Issue Date
Sep-2019
Publisher
SPIE
Keywords
EUV; EUV pellicle; HVM; Lithography; Particle; Relative crack time
Citation
Proceedings of SPIE - The International Society for Optical Engineering, v.11147
Indexed
SCOPUS
Journal Title
Proceedings of SPIE - The International Society for Optical Engineering
Volume
11147
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/4576
DOI
10.1117/12.2536992
ISSN
0277-786X
Abstract
To accelerate extreme ultraviolet lithography manufacturing, a better pellicle which has a longer lifetime is required. Various materials and their combinations are suggested and implemented to extend the lifetime. Using finite element method, we analyzed the mechanical behavior of pellicle in terms of crack time when a pellicle begins to tear off. Without thermal property analysis, we were able to get relative crack times for various pellicle structures. Single walled carbon nanotube has the largest relative crack time but needed to be commercialization and multi-layer pSi core pellicle has longer lifetime than a single pSi core pellicle. Additionally, increasing Ru capping layer helps to strengthen the mechanical properties of the pSi core pellicle. © 2019 SPIE.
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